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Further remarks on sequential estimation of a scale parameter in exponential distributions with an unknown location

JOURNAL ARTICLE published June 1997 in Microelectronics Reliability

Authors: Ajit Chaturvedi

https://doi.org/10.1016/s0026-2714(96)00133-3 Actions

Multi-stage point estimation of the common location parameter of several exponential distributions

JOURNAL ARTICLE published May 1996 in Microelectronics Reliability

Authors: Ajit Chaturvedi | Neeraj Tiwari | S.K. Pandey

https://doi.org/10.1016/0026-2714(95)00147-6 Actions

Estimation of scale parameters for two exponential distributions

JOURNAL ARTICLE published January 1991 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(91)90403-t Actions

On Bayes estimation for mixtures of two exponential life distributions from right-censored samples

JOURNAL ARTICLE published January 1987 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(87)90538-5 Actions

Consonance sets for 2-parameter Weibull and exponential distributions

JOURNAL ARTICLE published January 1980 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(80)90413-8 Actions

On shrinkage estimation of the exponential scale parameter

JOURNAL ARTICLE published January 1986 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(86)90838-3 Actions

Distribution of LRT for testing the equality of several 2-parameter exponential distributions

JOURNAL ARTICLE published January 1986 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(86)90049-1 Actions

Case study of Bayes parameter estimation of exponential distribution

JOURNAL ARTICLE published October 1993 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(93)90394-e Actions

Shrinkage estimation of threshold parameter of the exponential distribution

JOURNAL ARTICLE published January 1990 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(90)90318-h Actions

Sequential interval estimation procedures for the mean exponential survival time and reliability function

JOURNAL ARTICLE published January 1996 in Microelectronics Reliability

Authors: Ajit Chaturvedi

https://doi.org/10.1016/0026-2714(95)92649-n Actions

Point estimation of the parameter of a truncated exponential distribution

JOURNAL ARTICLE published January 1983 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(83)90796-5 Actions

Two properties of mixtures of exponential distributions

JOURNAL ARTICLE published January 1989 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(89)90070-x Actions

Estimation in the 2-parameter exponential distribution with prior information

JOURNAL ARTICLE published March 1996 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(96)81954-8 Actions

Adaptive robust estimation based on a family of generalized exponential power distributions

JOURNAL ARTICLE published January 1985 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(85)90230-6 Actions

Modified shrinkage technique for estimation of the exponential scale parameter

JOURNAL ARTICLE published January 1988 in Microelectronics Reliability

Authors: M.C. Shah | Renu Parmar

https://doi.org/10.1016/0026-2714(88)90323-x Actions

Bayes credibility estimation of an exponential parameter for random censoring and incomplete information

JOURNAL ARTICLE published January 1992 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(92)90139-c Actions

Prediction intervals for the two-parameter exponential distribution using incomplete data

JOURNAL ARTICLE published January 1985 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(85)90511-6 Actions

A note on sequential point estimation of the mean of a gamma population

JOURNAL ARTICLE published May 1997 in Microelectronics Reliability

Authors: Ajit Chaturvedi

https://doi.org/10.1016/s0026-2714(96)00144-8 Actions

Bayesian approach to life testing and reliability estimation under competing exponential failure distributions

JOURNAL ARTICLE published January 1989 in Microelectronics Reliability

Authors: Alex S. Papadopoulos | Ram C. Tiwari

https://doi.org/10.1016/0026-2714(89)90029-2 Actions

Estimators of two-parameter Weibull distributions from incomplete data with residual lifetimes

JOURNAL ARTICLE published December 1994 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(94)90360-3 Actions
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